MAPs Platform
Powerful analysis for Scanning Electron Microscopy and optical images — reproducible segmentation, roughness and size distributions.
Using MAP-Nano, the characterization process for novel materials is faster and more accurate than ever before.
Choose your area to see typical workflows, inputs and outputs.
Pick ROI and obtain distribution metrics (Weibull/Gaussian), with pre-configured and customizable edge detection.
State-of-the-art shape fitting to derive robust size distributions and morphological stats.
Study height distributions and roughness at different scales; build computational models from experimental data.
Run locally on Windows, Linux, macOS — or use a secure web interface for collaboration.
SEM/optical images (PNG/JPG/TIFF), batch folders, ROI masks.
CSV tables, annotated images, PDF reports, API JSON.
Thresholding, morphology, contour/skeleton, shape fitting, distributions (Weibull/Gaussian).
Windows, Linux, macOS, Browser (secure web).