MAPs Platform

MAP-Nano

Powerful analysis for Scanning Electron Microscopy and optical images - reproducible segmentation, roughness and size distributions.

Windows Linux macOS Web

SEM/optical - Batch pipelines - Roughness - Porosity - Morphology - CSV/PDF export

MAP-Nano - main UI
MAP-Nano software interface

Discover better materials, faster

Using MAP-Nano, the characterization process for novel materials is faster and more accurate than ever before.

Intuitive UI for fast inspection

Pick ROI and obtain distribution metrics (Weibull/Gaussian), with pre-configured and customizable edge detection.

  • Interactive ROI tools with masks
  • Batch mode for entire folders
  • Traceability and reproducibility
ROI and distribution tools

Shape detection & size distributions

State-of-the-art shape fitting to derive robust size distributions and morphological stats.

  • Contours, skeletons and curve fitting
  • Export to CSV/PDF and API
  • Quality checks and outlier control
Shape detection workflows

Surface roughness - done right

Study height distributions and roughness at different scales; build computational models from experimental data.

  • Ra / Rq / Rz and custom metrics
  • Multi-scale analysis
  • Reports with figures and tables
Surface roughness analysis

Web & cross-platform support

Run locally on Windows, Linux, macOS - or use a secure web interface for collaboration.

  • User management and roles
  • Versioned analyses
  • Cloud or on-prem deployment
Web and desktop support

Technical specs

Inputs

SEM/optical images (PNG/JPG/TIFF), batch folders, ROI masks.

Outputs

CSV tables, annotated images, PDF reports, API JSON.

Algorithms

Thresholding, morphology, contour/skeleton, shape fitting, distributions (Weibull/Gaussian).

Compatibility

Windows, Linux, macOS, Browser (secure web).